High-resolution near-field Raman microscopy of single-walled carbon nanotubes
Physical Review Letters, 2003•APS
We present near-field Raman spectroscopy and imaging of single isolated single-walled
carbon nanotubes with a spatial resolution of≈ 25 n m. The near-field origin of the image
contrast is confirmed by the measured dependence of the Raman scattering signal on tip-
sample distance and the unique polarization properties. The method is used to study local
variations in the Raman spectrum along a single single-walled carbon nanotube.
carbon nanotubes with a spatial resolution of≈ 25 n m. The near-field origin of the image
contrast is confirmed by the measured dependence of the Raman scattering signal on tip-
sample distance and the unique polarization properties. The method is used to study local
variations in the Raman spectrum along a single single-walled carbon nanotube.
Abstract
We present near-field Raman spectroscopy and imaging of single isolated single-walled carbon nanotubes with a spatial resolution of≈ 25 n m. The near-field origin of the image contrast is confirmed by the measured dependence of the Raman scattering signal on tip-sample distance and the unique polarization properties. The method is used to study local variations in the Raman spectrum along a single single-walled carbon nanotube.
American Physical Society